If there is a problem with the beam or SEM, please contact the Electron Microscopy Staff. Make sure the sample is mounted correctly. If the computer freezes, you can restart it by pressing Ctrl+Alt+Del for 10 seconds.īe careful when loading your sample through the Exchange Chamber. Under optimal working conditions, it can magnify images upwards of 800,000 times. It uses an electron beam to image the surface of solid materials. WE ARE ALWAYS WILLING TO HELP! Troubleshooting HR-SEM (Hitachi S-4800) The Hitachi S-4800 is a field emission scanning electron microscope (FE-SEM), capable of high resolution imaging and specimen topography study from nanometers to millimeters. Start with medium currents, if the current increases, you may have more signal represented in brightness if the current decreases, you may be able to observe areas with a smaller resolution, but with lower signal.įOR FURTHER QUESTIONS, PLEASE CONTACT THE ELECTRON MICROSCOPY STAFF. You may expect an interaction between the electron beam and your sample, which may leave an observation (contamination or degradation) box, the higher the current, the stronger it will be. If your sample is a polymer, use low voltages, (<10kV) if your sample is a ceramic or metal, you can use higher currents. The Voltage selected depends on your sample material. The voltages selected can be between 500V and 30kV. Reduce the voltage used or make your sample conductive by applying a conductive coating (C or Au/Pd). Make sure your sample is below the maximum height (exchange chamber height), and the screw is not below the holder base. Hitachi S-4800 is an electron beam microscope, that accelerates an electron beam in a vacuum environment to interact electrons with the sample of interest. A specimen stage for large sample applications with 110mm x 110mm stage movement and computer controlled 5 axes motorization with graphical interface software. With the Hitachi STEM detector on the S-4800 FESEM images, comparable to a dedicated TEM or STEM results, are easily obtainable without the need for an advanced experience in TEM or the large budget for such high-end equipment.The Super ExB Filter collects and separates the various components of pure SE, compositional SE and BSE electron signals. An objective lens design with "Super ExB Filter" technology.A choice of specimen stage: 4", 2" and 1" wafer and cross section.Accelerating voltages are from 500 V to 30 kV An ultra-high-resolution SEM capable of ultra-low voltage imaging large specimens up to 6' EDAX EDS system Resolution, 1.0 nm, acceleration voltage of.Focused Ion & Electron Beam System nanoDUET NB5000 Hitachi FIBSEM. The TM300 Tabletop Scanning Electron Microscope (SEM) is a selected kV/selected. The equipment is equipped with a EDX detector for the detection of chemical elements on your sample at higher voltages. S4800 The S4800 is a Cold Field Emission Scanning Electron Microsocpe (CFE. The S-4800 Cold Field Emission SEM combines the outstanding high-resolution performance capabilities to offer superb resolution of ~ 2.0 nm at 30 kV.
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